Russian Academy of Sciences
Far East Branch
Chemistry Institute
No. |
Analyzed objects |
Analyzed elements |
Methods |
Instrumentation |
Note |
1 |
2 |
3 |
4 |
6 |
7 |
1. |
Any objects in a power and liquid form |
Al to Pu
|
Analyzer of minute quantities of substance (TXRF-8030ñ). Energy dispersion X-ray fluorescent method with complete and external reflection (coming in 2003) |
Excitation sources: Mo-, Ag-, W-pipes; collimation systems of exciting and recording radiation. Detector – Si(Li) with RMn=150eV. |
1) In solid state, same as in EDRXF. 2) In liquid state, with clear, desalted matrix from K-solution (m ≥k.μkg). Detection limit along K-lines up to 10-8%. Simultaneous analysis of all elements |
2. |
Any objects in a power and liquid form |
K to Br – along Ê-lines, Âr to W –along L-lines |
Energy dispersion X-ray fluorescent method with radionuclide excitation source (EDRXF) |
Excitation source–Pu238 isotope. Detector – Si (Li) with RMn=190 eV. |
Simplified sample preparation, sample analysis, m ≥10μg. Detection limit (Lim) (along Ê-lines), up to 10-3÷-4%; along L-lines, up to 10-2÷-3%. %. Simultaneous analysis of all elements |
3. |
Any objects, converted into solution |
Alkali, alkaline-earth, noble and transition metals, rare earths, mercury, etc. |
Atomic absorptive analysis |
ÀÀ-780 and GGX-6A Atomic absorptive spectrophotometers, AAS vario 6 graphite dish, mercury analyzer “Yulia”-2m |
Minimal volumes of analyzed solutions (of the order of 5-50μl). Absolute sensitivity of determinations varies from (1-2)·10-12g for cadmium and zinc, up to (2-3)·10-10 g for nickel, titanium and vanadium. This allows determination of element concentrations of the order of 10-9 g/ml in a 20μl-sample solution. Duration of one cycle 1-2 min.
|
4. |
Rocks, minerals, soils, and other objects |
The whole range of elements |
Semiquantitative spectral analysis |
PGS-2 spectrometer. |
- |
5. |
Atomic structures of monocrysts of nonorganic and organic bioorganic origin |
– |
X-ray structure analysis |
"Bruker SMART 1000 CCD" X-ray diffractometer. The diffractometer is equipped with a low-temperature attachment allowing measurements in a temperature range of 300 to 77K. |
High sensitivity of detector and high precision of setup angles of goniometer (±0.0005°) make it possible to substantially minimize X-ray experiment time conditioning qualitative results. The software allows computerization of information processing |
6. |
Powders, films, solutions, gases |
– |
IR-, Raman-spectroscopy (combinational scattering) |
EQUINOX 55S infrared Fourier spectrometer (“BRUKER”). The spectrometer uses a He-Ne-laser with a wavelength of 633km nm (red), 1mW. |
The OPUS/IR program package controls the spectrometer, signal registration and spectra processing. Supplementary ports for the beam allow a wide range of different detachable devices, including an infrared microscope, a Fourier-Raman module FRA 106/S for ÊD spectra |